ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,891, issued on Sept. 8, was assigned to Amazon Technologies Inc. (Seattle). "Hybrid scanning using deferral learning" was invented by Micha... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,892, issued on Sept. 8, was assigned to HITACHI LTD. (Tokyo). "Analysis evasion function detection system and analysis evasion function det... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,893, issued on Sept. 8, was assigned to Halcyon Tech Inc. (Austin, Texas). "Antiransomware using machine learning" was invented by Ryan Smi... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,895, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands). "Apparatuses and methods for verification of updated data-set" w... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,896, issued on Sept. 8, was assigned to Rapid7 Inc. (Boston). "Refining a machine learning model for calculating confidence scores associat... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,897, issued on Sept. 8, was assigned to Acronis International GmbH (Schaffhausen, Switzerland). "Automation platform for pentest collaborat... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,898, issued on Sept. 8, was assigned to NXP B.V. (Eindhoven, Netherlands). "Testing of security systems in integrated circuits" was invente... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,899, issued on Sept. 8, was assigned to FORTINET INC. (Sunnyvale, Calif.). "Generating monitoring programs for detecting actions in softwar... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,900, issued on Sept. 8, was assigned to NEC Corp. (Tokyo). "System design device, system design method, and storage medium" was invented by... और पढ़ें
ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,901, issued on Sept. 8, was assigned to PANASONIC AUTOMOTIVE SYSTEMS Co. LTD. (Kanagawa, Japan). "Assessment apparatus and assessment metho... और पढ़ें